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Title: | A new classification of path-delay fault testability in terms of stuck-at faults |
Other Titles: | (In) Journal of Computer Science and Technology |
Authors: | https://link.springer.com/article/10.1007/BF02973460 Majumder, Subhashis |
Issue Date: | 2004 |
Publisher: | Hybrid |
Series/Report no.: | Vol : 19;Issue : 6 |
Abstract: | A new classification of path-delay fault testability in a combinational circuit is presented in terms of testability of stuck-at faults in an equivalent circuit. Earlier results describing correlation of path-delay and stuck-at faults are either incomplete, or use a complex model of equivalent circuit based on timing parameters. It is shown here that a path-delay fault (rising or falling) is testable if and only if certain single or multiple stuck-at fault in the equivalent circuit is testable. Thus, all aspects of path-delay faults related to testability under various classification schemes can be interpreted using the stuck-at fault model alone. The results unify most of the existing concepts and provide a better understanding of path-delay faults in logic circuits. |
URI: | http://172.16.0.4:8085/heritage/handle/123456789/7416 |
Appears in Collections: | Computer Science And Engineering (Publications) |
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