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Issue Date
Title
Author(s)
2019
Reliability analysis through linearity and harmonic distortion of a dualmaterial-gate asymmetric underlapped DGMOSFET
Das, Rahul
;
Dasgupta, Arpan
;
Kundu, Atanu
2021-04
Memoryless nonlinearity in IT JL FinFET with spacer technology: Investigation towards reliability
Vandana, B.
;
Mohapatra, S.K.
;
Das, J.K.
;
Pradhan, K.P.
;
Kundu, A.
;
Kaushik, B.K.
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Author
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Das, J.K.
1
Das, Rahul
1
Dasgupta, Arpan
1
Kaushik, B.K.
1
Kundu, A.
1
Kundu, Atanu
1
Mohapatra, S.K.
1
Pradhan, K.P.
1
Vandana, B.
Subject
1
Analog/ RF performance
1
Analog/RF
1
Dual-material gate
1
FinFET
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Harmonic distortion (HD)
1
Junctionless MOSFET
1
Low-k to high-k materials
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Single-stage amplifier
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Source underlap
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Spacer
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Date issued
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2019
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2021
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