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Issue Date	Title	Author(s)
2004	ON FINDING A STAIRCASE CHANNEL WITH MINIMUM CROSSING NETS IN A VLSI FLOOR PLAN	Majumder, Subhashis
2004	A new classification of path-delay fault testability in terms of stuck-at faults	https://link.springer.com/article/10.1007/BF02973460; Majumder, Subhashis
2016	Publications of Computer Science and Engineering	-