Please use this identifier to cite or link to this item:
http://localhost:80/xmlui/handle/123456789/9164
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.date.accessioned | 2024-10-21T05:47:56Z | - |
dc.date.available | 2024-10-21T05:47:56Z | - |
dc.date.issued | 2024 | - |
dc.identifier.uri | http://localhost:80/xmlui/handle/123456789/9164 | - |
dc.language.iso | en | en_US |
dc.subject | ELECTRICAL AND ELECTRONIC MEASUREMENTS | en_US |
dc.subject | Applied Electronics & Instrumentation Engineering | en_US |
dc.subject | AEIE 2203/2024 | en_US |
dc.title | B.Tech_AEIE_4th Sem_ELECTRICAL AND ELECTRONIC MEASUREMENTS | en_US |
dc.type | Image | en_US |
Appears in Collections: | 2024_B.Tech_AEIE_1st Sem to 8th Sem |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
ELECTRICAL AND ELECTRONIC MEASUREMENTS-AEIE 2203-2024.pdf | 642.63 kB | Adobe PDF | View/Open |
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