Please use this identifier to cite or link to this item: http://localhost:80/xmlui/handle/123456789/4737
Full metadata record
DC FieldValueLanguage
dc.date.accessioned2021-02-03T06:56:30Z-
dc.date.accessioned2021-02-03T06:56:38Z-
dc.date.accessioned2021-02-03T06:56:44Z-
dc.date.available2021-02-03T06:56:30Z-
dc.date.available2021-02-03T06:56:38Z-
dc.date.available2021-02-03T06:56:44Z-
dc.date.issued2019-
dc.identifier.urihttp://172.16.0.4:8085/heritage/handle/123456789/4737-
dc.language.isoenen_US
dc.subjectResearch Methodology and IPRen_US
dc.subjectECEN 5103/2019en_US
dc.subjectVery Large Scale Instrumentationen_US
dc.titleM.Tech_VLSI_1st Sem_Research Methodology and IPRen_US
dc.typeOtheren_US
Appears in Collections:2019_M.Tech_VLSI_1st Sem to 3rd Sem

Files in This Item:
File Description SizeFormat 
ECEN 5103.pdf19.93 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.