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Please use this identifier to cite or link to this item: http://localhost:80/xmlui/handle/123456789/4272
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dc.date.accessioned2020-10-20T06:25:21Z-
dc.date.available2020-10-20T06:25:21Z-
dc.date.issued2020-01-
dc.identifier.issn4821-1128-
dc.identifier.urihttp://172.16.0.4:8085/heritage/handle/123456789/4272-
dc.language.isoen_USen_US
dc.publisherGlobal Research Publication New Delhi (Indian)en_US
dc.relation.ispartofseriesVolume 10;Number 1-
dc.subjectIndian Journal of Electronic Networks, Devices and Fielden_US
dc.subjectOn-line Error Detection with Equal Protection Against All Errorsen_US
dc.subjectHigh Speed Interconnect Data Dependent Jitter Analysisen_US
dc.subjectDesigning Concurrent Checking Circuits by using Partitioningen_US
dc.subjectSiGe BiCMOS Low Power Voltage Comparator for Extreme Temperature Range Applicationsen_US
dc.subjectNew Self-checking Array and Wallace Tree Multipliersen_US
dc.titleIndian Journal of Electronic Networks, Devices and Fielden_US
dc.typeImageen_US
Appears in Collections:Alerting of New Journals (ECE)

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