Please use this identifier to cite or link to this item: http://localhost:80/xmlui/handle/123456789/3578
Title: Polarizing phase shifting interferometry of total internal reflection light for measurement of refractive index and its spatial variation in liquid samples
Other Titles: (In) Optical Engineering
Authors: Das, Tania
Bhattacharya, Kallol
Keywords: Total Internal Reflection
Evanescent Wave
Phases Shifting
Refractive Index
Issue Date: 2016
Series/Report no.: Vol. 55;No. 7
Abstract: It is well known that the phase change in total internal reflection (TIR) is a function of the refractive indices of the pair of media involved. The spatial phase variations in a totally internally reflected beam are accurately measured using a Mach Zehnder interferometer employing polarization phase shifting technique. The evaluated phase change is then related to the refractive index variations of the rarer medium. One of the salient features of the proposed technique is that, unlike most interferometric methods where the measured phase is a function of the sample thickness, TIR phase is independent of the sample thickness as long as the evanescent wave field is fully confined within the sample. The theory of the technique is discussed and experimental results showing the three-dimensional profiles of the measured refractive indices and its spatial variations are presented.
URI: 10.1117/1.OE.55.7.077102
http://172.16.0.4:8085/heritage/handle/123456789/3578
Appears in Collections:Applied Electronics and Instrumentation Engineering (Publications )

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