Please use this identifier to cite or link to this item:
http://localhost:80/xmlui/handle/123456789/11250Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.date.accessioned | 2026-05-25T09:08:42Z | - |
| dc.date.available | 2026-05-25T09:08:42Z | - |
| dc.date.issued | 2025 | - |
| dc.identifier.uri | http://localhost:80/xmlui/handle/123456789/11250 | - |
| dc.language.iso | en | en_US |
| dc.subject | RESEARCH METHODOLOGY AND IPR | en_US |
| dc.subject | AEI5103 | en_US |
| dc.subject | Applied Electronics & Instrumentation Engineering | en_US |
| dc.title | M.Tech_AEIE_1st Sem_RESEARCH METHODOLOGY AND IPR | en_US |
| dc.type | Image | en_US |
| Appears in Collections: | 2025_M.Tech_AEIE_1st Sem to 4th Sem | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| RESEARCH METHODOLOGY AND IPR_AEI 5103_2025.pdf | 199.9 kB | Adobe PDF | View/Open |
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